Sebastien Thomet (PhD student, CELL team, STMicro) was awarded the “Outstanding Student Paper Award” during the 34th IEEE International Symposium on Defect and Fault (DFT) Tolerance in VLSI and Nanotechnology Systems for his paper entitled “FIRECAP: Fail-Reason Capturing hardware module for a RISC-V based System on a Chip”.
Student Paper Award for Sebastien Thomet at 34th DFT IEEE Conference
13 December 2021 par Aymeric Histace
08 December 2021 par Aymeric Histace
06 December 2021 par Aymeric Histace