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ETIS Seminar: Pr. Otmane Ait Mohamed (Concordia University , Montréal)

SAT based Framework for Estimating Vulnerability of Digital Circuits Recent deep-submicron technology-based integrated circuits (ICs) are substantially more susceptible to transient faults. Thus, the soft errors that occurred due to transient faults are more important than they have ever been. As a result, it is critical to identify any functional inconsistencies and component failures as […]

MIDI Seminar: Mourad Khayati

CY Cergy Paris Université, site de Saint-Martin 2 Av. Adolphe Chauvin, Pontoise, France

Title: Coalescing Data Repair: How to recover from losing your sensor data? Abstract With the emergence of the Internet of Things (IoT), time series streams have become ubiquitous in our daily life. Recording such data is rarely a neat process, as sensor failures, power outages, and transmission problems frequently occur, yielding occasional blocks of data […]